Photodetector having wide dynamic range and low temperature dependence

ABSTRACT

A photodetector of a wide dynamic range of incident light amount detection and low temperature dependence is provided. A first signal processing unit  10   m,n  includes an integrating circuit  11 , a first holding circuit  12 , a comparing circuit  13 , a second holding circuit  14 , and a latching circuit  15 . The integrating circuit  11  has a variable capacitor unit that is selectively set to a capacitance value among a plurality of capacitance values, accumulates charges, output from the photodiode, into the variable capacitor unit over an accumulating period that is in accordance with the capacitance value set at the variable capacitor unit, and outputs a voltage V 1  that is in accordance with the amount of the accumulated charges. The comparing circuit  13  inputs the voltage V 1  output from the integrating circuit  11 , performs a quantitative comparison of the voltage V 1  with a reference voltage V ref , outputs a compared signal S 3  expressing the result of comparison, and, when the voltage V 1  output from the integrating circuit  11  at the end of an accumulating period is less than the reference voltage V ref , instructs the first holding circuit  12  to hold the voltage.

TECHNICAL FIELD

The present invention relates to a photodetector.

BACKGROUND ART

Among photodetectors, there are known types in which current signals, generated by photodiodes according to incident light amounts, are logarithmically compressed and output as voltage signals (see, for example, Patent Document 1 and Patent Document 2). This type of photodetector has a merit of being wide in the dynamic range of incident light amount detection.

-   Patent Document 1: Japanese Published Unexamined Patent Application     No. Hei 11-155105 -   Patent Document 2: Japanese Published Unexamined Patent Application     No. Hei 5-219443

However, a photodetector that employs such a logarithmic compression method has a problem that the logarithm compression characteristics (that is, the incident light amount detection characteristics) vary largely with temperature.

The present invention has been made to resolve the above problem and an object thereof is to provide a photodetector with a wide dynamic range of incident light amount detection and a small temperature dependence.

DISCLOSURE OF THE INVENTION

A photodetector according to the present invention includes: (1) a photodiode, generating charges of an amount that is in accordance with an incident light amount; (2) an integrating circuit, having a variable capacitor unit that is selectively set to a capacitance value C_(n) among K capacitance values C₁ to C_(K), accumulating charges, output from the photodiode, into the variable capacitor unit over an accumulating period T_(k) that is in accordance with a capacitance value C_(k) set in the variable capacitor unit, and outputting a voltage according to the amount of the accumulated charges; (3) a first holding circuit, holding the voltage output from the integrating circuit at the end of an accumulating period T_(k) among accumulating periods T₁ to T_(K) and outputting the held voltage; and (4) a comparing circuit, inputting the voltage output from the integrating circuit or the first holding circuit, performing a quantitative comparison of the input voltage with a reference voltage, outputting a compared signal expressing the result of comparison, and, when the voltage output from the integrating circuit or the first holding circuit at the end of an accumulating period T_(k) is less than the reference voltage, instructing the first holding circuit to hold the voltage.

The photodetector is also characterized in that the value of a ratio, (T_(k)/C_(k)), differs according to the value of k. Preferably, a ratio of a ratio (T_(k1)/C_(k1)) with respect to a ratio (T_(k2)/C_(k2)) is a power of 2. Here, K is an integer no less than 2, each of k, k1, and k2 is an arbitrary integer no less than 1 and no more than K, and k1 and k2 differ from each other.

With this photodetector, the variable capacitor unit of the integrating circuit is selectively set to a capacitance value C_(n) among K capacitance values C₁ to C_(K). Charges output from the photodiode are accumulated into the variable capacitor unit over the accumulating period T_(k) that is in accordance with the capacitance value C_(k) set in the variable capacitor unit, and a voltage is output from the integrating circuit according to the amount of the accumulated charge.

The first holding circuit holds the voltage output from the integrating circuit at the end of an accumulating period T_(k) among accumulating periods T₁ to T_(K) and the held voltage is output from the first holding circuit. The comparing circuit performs quantitative comparison of the voltage output from the integrating circuit or the first holding circuit with the reference voltage and outputs the compared signal expressing the result of comparison.

When the voltage output from the integrating circuit or the first holding circuit at the end of an accumulating period T_(k) is less than the reference voltage, the voltage held by the first holding circuit is held thereafter as well. Thus by performing predetermined computations based on the voltage, output from the comparing circuit at the end of an accumulating period T_(k) and held by the first holding circuit, and the compared signal, output from the comparing circuit and expressing the accumulating period T_(k), the photodetector can perform image pickup over a wide dynamic range.

Preferably with the photodetector according to the present invention, the first holding circuit serves in common as a CDS circuit that inputs the voltage output from the integrating circuit and holds and outputs a voltage that is in accordance with the difference of the voltages that are respectively input at a beginning and an end of the accumulating period T_(k). When the first holding circuit thus serves in common as a CDS (Correlated Double Sampling) circuit, error due to noise generated during resetting of an amplifier that is included in the integrating circuit (that is, kTC noise) is reduced and the photodetector can obtain more accurate image pickup data.

Preferably, the photodetector according to the present invention further includes (1) a second holding circuit, inputting a voltage output from the first holding circuit, holding the voltage at a specific point in time, and outputting the held voltage, and (2) a latching circuit, inputting a compared signal output from the comparing circuit, storing the compared signal at the specific point in time, and outputting the stored compared signal.

By the provision of the second holding circuit and the latching circuit that respectively holds and stores the data obtained by image pickup, image pickup data can be obtained in the same period in which image pickup data, obtained by the photodiode, the integrating circuit, the first holding circuit, and the comparing circuit in a previous period, are being processed. This photodetector can thus perform high-speed image pickup.

The photodetector according to the present invention preferably further includes an A/D converting circuit, inputting the voltage output from the first holding circuit, converting the input voltage into a digital value, and outputting the digital value. It is furthermore preferable for a bit shifting circuit, which inputs the digital value output from the A/D converting circuit, inputs the compared signal output from the comparing circuit, performs bit shifting of the digital value based on the compared signal, and outputs the bit-shifted digital value, to be included.

It is furthermore preferable for a switched capacitor circuit, which inputs the voltage output from the first holding circuit, holds the voltage in a capacitor unit, and outputs the held voltage to the A/D converting circuit, to be included. In these cases, the image pickup data, obtained by the photodiode, the integrating circuit, the first holding circuit, and the comparing circuit are converted into digital values by the A/D converting circuit. The digital values output from the A/D converting circuit are bit shifted by just the necessary number of bits based on the compared signal by the bit shifting circuit.

The photodetector according to the present invention preferably includes a plurality of sets of the photodiode, the integrating circuit, the first holding circuit, and the comparing circuit and has a single the A/D converting circuit for the plurality of sets. It is furthermore preferable that a plurality of sets of the photodiode, the integrating circuit, the first holding circuit, the comparing circuit, the second holding circuit, and the latching circuit be equipped, and that one set of the switched capacitor circuit, the A/D converting circuit, and the bit shifting circuit be equipped for the plurality of the abovementioned sets.

The photodetector according to the present invention is wide in the dynamic range of incident light amount detection and small in temperature dependence.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic block diagram of a photodetector 1 according to an embodiment;

FIG. 2 is a block diagram of a first signal processing unit 10 _(m,n) of the photodetector 1 according to the embodiment;

FIG. 3 is a circuit diagram of a comparing circuit 13 of the photodetector 1 according to the embodiment;

FIG. 4 is a block diagram of a second signal processing unit 20 of the photodetector 1 according to the embodiment;

FIG. 5 shows diagrams for describing operations of a bit shifting circuit 28 of the photodetector 1 according to the embodiment;

FIG. 6 is a timing chart for describing operations of the photodetector 1 according to the embodiment;

FIG. 7 is a timing chart for describing operations of the photodetector 1 according to the embodiment; and

FIG. 8 is a timing chart for describing operations of the photodetector 1 according to the embodiment.

DESCRIPTION OF THE SYMBOLS

-   1 photodetector -   10 first signal processing unit -   11 integrating circuit -   12 first holding circuit -   13 comparing circuit -   14 second holding circuit -   15 latching circuit -   20 second signal processing unit -   26 switched capacitor circuit -   27 A/D converting circuit -   28 bit shifting circuit -   A amplifier -   C capacitor -   PD photodiode -   SW switch

BEST MODES FOR CARRYING OUT THE INVENTION

A best mode for carrying out the present invention shall now be described in detail with reference to the drawings. In the description of the drawings, elements that are the same shall be provided with the same symbol and redundant description shall be omitted.

FIG. 1 is a schematic block diagram of a photodetector 1 according to an embodiment.

The photodetector 1, shown in this FIGURE, has M×N photodiodes PD_(1,1) to PD_(M,N), M×N first signal processing units 10 _(1,1) to 10 _(M,N), and a single second signal processing unit 20. As shown in the FIGURE, the M×N photodiodes PD_(1,1) to PD_(M,N) are positioned within a predetermined rectangular area. The M×N first signal processing units, 10 _(1,1) to 10 _(M,N) and the single second signal processing unit 20 are positioned outside one side of the abovementioned rectangular region. Each of M and N is an integer no less than 2. In the following, m is an arbitrary integer no less than 1 and no more than M, and n is an arbitrary integer no less than 1 and no more than N.

The M×N photodiodes, PD_(1,1) to PD_(M,N) are arrayed in two dimensions in M rows and N columns. A photodiode PD_(m,n) is positioned at the m-th row and n-th column. Each photodiode PD_(m,n) generates charges of an amount that is in accordance with an incident light amount. Each first signal processing unit 10 _(m,n) is disposed in one-to-one correspondence to a photodiode PD_(m,n), inputs the charges output from the corresponding photodiode PD_(m,n), and outputs a voltage that is in accordance with the amount of the charges input. The second signal processing unit 20 inputs the voltages that are successively output from the respective M×N first signal processing units 10 _(1,1) to 10 _(M,N), converts the voltages (analog values) to digital values, and outputs the digital values.

FIG. 2 is a block diagram of a first signal processing unit 10 _(m,n) of the photodetector 1 according to the embodiment. The M×N first signal processing units 10 _(1,1) to 10 _(M,N) respectively have a common arrangement. Each first signal processing unit 10 _(m,n) includes an integrating circuit 11, a first holding circuit 12, a comparing circuit 13, a second holding circuit 14, and a latching circuit 15. The photodiode PD_(m,n) is also shown in this FIGURE. An anode terminal of the photodiode PD_(m,n) is grounded.

The integrating circuit 11 has an amplifier A₁, capacitors C₁₀ to C₁₂, and switches SW₁₀ to SW₁₂. The amplifier A₁ has its non-inverted input terminal grounded and its inverted input terminal connected to a cathode terminal of the photodiode PD_(m,n). Between the inverted input terminal and an output terminal of the amplifier A₁, the switch SW₁₀, the capacitor C₁₀, the serially connected switch SW₁₁ and capacitor C₁₁, and the serially connected switch SW₁₂ and capacitor C₁₂ are connected in parallel.

The capacitors C₁₀ to C₁₂ and the switches SW₁₁ and SW₁₂ make up a variable capacitor unit. This variable capacitor unit is selectively set to a capacitance value among capacitance values C₁ to C₃ as expressed by formulae (1) below. That is, the capacitance value C₁ of the variable capacitor unit when both switches SW₁₁ and SW₁₂ are open is equivalent to the capacitance value of the capacitor C₁₀. The capacitance value C₂ of the variable capacitor unit when the switch SW₁₁ is closed and the switch SW₁₂ is open is equivalent to the sum of the respective capacitance values of the capacitors C₁₀ and C₁₁. The capacitance value C₃ of the variable capacitor unit when both switches SW₁₁ and SW₁₂ are closed is equivalent to the total of the respective capacitance values of the capacitors C₁₀ to C₁₃. C ₁ =C ₁₀  (1a) C ₂ =C ₁₀ +C ₁₁  (1b) C ₃ =C ₁₀ +C ₁₁ +C ₁₂  (1c)

When the switch SW₁₀ is open, the integrating circuit 11 accumulates charges output from the photodiode PD_(m,n) over an accumulating period T_(k) that is in accordance with the capacitance value C_(k) set at the variable capacitor unit and then outputs a voltage V₁ that is in accordance with the amount of the accumulated charges. With the integrating circuit 11, by the closing of switches SW₁₀ to SW₁₂, the charges accumulated in the capacitors C₁₀ to C₁₂ are discharged and the output voltage is initialized. Here, k is an arbitrary integer no less than 1 and no more than 3.

The value of a ratio (T_(k)/C_(k)) differs according to the value of k. That is, a relationship expressed by a formula (2) indicated below holds among the capacitance values C₁ to C₃ and the accumulating periods T₁ to T₃. Preferably, relationships expressed by formulae (3) indicated below also hold among these parameters. Here, each of p and q is an integer no less than 1. More preferably, the accumulating periods T₁ to T₃ differ mutually and a relationship expressed by a formula (4) indicated below holds among these accumulating periods.

$\begin{matrix} {\frac{T_{1}}{C_{1}} > \frac{T_{2}}{C_{2}} > \frac{T_{3}}{C_{3}}} & (2) \\ {\frac{T_{1}}{C_{1}} = {2^{p}\frac{T_{2}}{C_{2}}}} & \left( {3a} \right) \\ {\frac{T_{2}}{C_{2}} = {2^{q}\frac{T_{3}}{C_{3}}}} & \left( {3a} \right) \\ {T_{1} > T_{2} > T_{3}} & (4) \end{matrix}$

The first holding circuit 12 has switches SW₂₁ and SW₂₂, a capacitor C₂, and an amplifier A₂. One end of the capacitor C₂ is grounded via the switch SW₂₁ and is connected to an input terminal of the amplifier A₂. The other end of the capacitor C₂ is connected via the switch SW₂₂ to the output terminal of the amplifier A₁ of the integrating circuit 11.

By the respective opening and closing operations of the switches SW₂₁ and SW₂₂, the first holding circuit 12 holds the voltage V₁, output from the integrating circuit 11 in the capacitor C₂ at an end of an accumulating period T_(k) among accumulating periods T₁ to T₃, inputs the held voltage into the amplifier A₂, and outputs a voltage V₂ from the amplifier A₂. The first holding circuit 12 serves in common as a CDS circuit and can input the voltage V₁, output from the integrating circuit 11, and output the output voltage V₂, which is in accordance with a difference of the voltages that are respectively input at a start and an end of the accumulating period T_(k).

The comparing circuit 13 inputs the voltage V₁, output from the integrating circuit 11, performs quantitative comparison of this input voltage V₁ and a reference voltage V_(ref), and outputs a compared signal S₃, expressing the result of comparison, to the latching circuit 15. If the voltage V₁, output from the integrating circuit 11 at the end of an accumulating period T_(k), is less than the reference voltage V_(ref), the comparing circuit 13 instructs the first holding circuit 12 to hold the voltage V₂. The latching circuit 15 stores and outputs the compared signal S₃ output from the compared circuit 13. The latching circuit 15 is arranged, for example, from parallel registers of the same number of bits as the number of bits of the compared signal S₃.

The second holding circuit 14 has a capacitor C₄ and switches SW₄₁ to SW₄₄. One end of the capacitor C₄ is connected via the switch SW₄₁ to an output terminal of the amplifier A₂ of the first holding circuit 12 and is grounded via the switch SW₄₂. The other end of the capacitor C₄ is grounded via the switch SW₄₃ and is connected via the switch SW₄₄ to the exterior. By the respective opening and closing operations of the switches SW₄₁ to SW₄₄, the second holding circuit 14 inputs the voltage V₂ output from the first holding circuit 12, holds the voltage at a specific point in time in the capacitor C₄, and outputs the held voltage to the exterior. (Actually, because a switched capacitor circuit is connected as shall be described below, charges Q₄, the value of which is in accordance with the held voltage, are output to the exterior.)

That is, with the second holding circuit 14, the charges accumulated in the capacitor C₄ are discharged by the closing of the switches SW₄₂ and SW₄₃. The voltage that is input when the switches SW₄₁ and SW₄₃ are closed and the switch SW₄₂ is open is held in the capacitor C₄, and when the switches SW₄₁ and SW₄₃ open, the voltage is kept held as it is in the capacitor C₄. When the switches SW₄₄ and SW₄₂ close, the charges Q₄, the value of which is in accordance with the voltage held in the capacitor C₄, are output.

FIG. 3 is a circuit diagram of the comparing circuit 13 of the photodetector 1 according to the embodiment. As shown in this FIGURE, the comparing circuit 13 has a comparator 30 and D flip-flops 31 and 32. The comparator 30 inputs the voltage V₁, output from the integrating circuit 11, also inputs the reference voltage V_(ref), and performs a quantitative comparison of the voltage V₁ and the reference voltage V_(ref). An output level V₃ of the comparator 30 is set to a high level if the voltage V₁ is greater than the reference voltage V_(ref) and is set to a low level if the voltage V₁ is not greater than the reference voltage V_(ref).

With each of the D flip-flops 31 and 32, when a Clr signal that is input into a CLR input terminal is of a high level, an output level from a Q output terminal is of a low level. With each of the D flip-flops 31 and 32, the output voltage V₃ from the comparator 30 is input into a clock input terminal, and when this voltage V₃ changes from the low level to the high level, the signal level input into a D input terminal up until then is output from the Q output terminal.

The D flip-flops 31 and 32 make up a shift register, and the Q output terminal of the D flip-flop 31 of the preceding stage and the D input terminal of D flip-flop 32 of the subsequent stage are connected to each other. A high level signal is constantly input into the D input terminal of the D flip-flop 31 of the preceding stage. A signal S₃₁, output from the Q output terminal of the D flip-flop 31 of the preceding stage, and a signal S₃₂, output from the Q output terminal of the D flip-flop 32 of the subsequent stage, make up the 2-bit compared signal S₃, output from the comparing circuit 13.

FIG. 4 is a block diagram of the second signal processing unit 20 of the photodetector 1 according to the embodiment. As shown in this FIGURE, the second signal processing unit 20 includes a switched capacitor circuit 26, an A/D converting circuit 27, and a bit shifting circuit 28.

The switched capacitor circuit 26 has an amplifier A₆, a capacitor C₆, and a switch SW₆. The amplifier A₆ has its non-inverted input terminal grounded and its inverted input terminal connected to the switch SW₄₄ of the second holding circuit 14. Between the inverted input terminal and an output terminal of the amplifier A₆, the switch SW₆ and the capacitor C₆ are connected in parallel.

When the switch SW₆ is open, the switched capacitor circuit 26 inputs the charge value Q₄ output from the second holding circuit 14, holds the charge value Q₄ in the capacitor C₆, and outputs a voltage V₆ that is in accordance with the held charge amount to the A/D converting circuit 27. With the switched capacitor circuit 26, by the closing of the switch SW₆, the charges accumulated in the capacitor C₆ are discharged and the output voltage is initialized.

The A/D converting circuit 27 inputs the voltage V₆, output from the second holding circuit 14, held by the switched capacitor circuit 26, and output from the switched capacitor circuit 26, converts this input voltage V₆ (analog value) into a digital value, and outputs the digital value D₇.

The bit shifting circuit 28 inputs the digital value D₇, output from the A/D converting circuit 27, inputs the compared signal S₃, output from the comparing circuit 13 and arriving via the latching circuit 15, performs bit shifting of the digital value D₇ according to the compared signal S₃, and outputs a bit-shifted digital value D₈.

FIG. 5 shows diagrams for describing operations of the bit shifting circuit 28 of the photodetector 1 according to the embodiment. Each of FIGS. 5A to 5C shows a relationship between the digital value D₇, output from the A/D converting circuit 27 and input into the bit shifting circuit 28, and the digital value D₈, output from the bit shifting circuit 28. In the following, the voltage V₁, output from the integrating circuit 11 at the end of the accumulating period T_(k) with the variable capacitor unit of the integrating circuit 11 being set to the capacitance value C_(k), shall be expressed as V_(1,k).

It shall also be deemed that the capacitance values C₁ to C₃, selectively set in the variable capacitor unit of the integrating circuit 11, and the accumulating periods T₁ to T₃ satisfy the relationships of the above-described formulae (1) to (3). Here, the number of bits of the output digital value D₈ is equal to the result of adding p and q in the formulae (3) to the number of bits of the input digital value D₇. Each of p and q is no more than the number of bits of the input digital value D₇.

FIG. 5-(a) shows a relationship between the input digital value D₇ and the output digital value D₈ when the comparing circuit 13 judges that each of voltages V_(1,1) to V_(1,3) is less than the reference voltage V_(ref). In this case, the output digital value D₈ is the same in value as the input digital value D₇, and the value 0 is placed in each of the upper (p+q) bits.

FIG. 5-(b) shows a relationship between the input digital value D₇ and the output digital value D₈ when the comparing circuit 13 judges that the voltage V_(1,1) is equal to or greater than the reference voltage V_(ref) and each of the voltages V_(1,2) and V_(1,3) is less than the reference voltage V_(ref). In this case, the output digital value D₈ takes on the value obtained by shifting the input digital value D₇ upward by just p bits and the value 0 is placed in each of the lower p bits and the upper q bits.

FIG. 5-(c) shows a relationship between the input digital value D₇ and the output digital value D₈ when the comparing circuit 13 judges that each of the voltages V_(1,1) and V_(1,2) is equal to or greater than the reference voltage V_(ref) and the voltage V_(1,3) is less than the reference voltage V_(ref). In this case, the output digital value D₈ takes on the value obtained by shifting the input digital value D₇ upward by just (p+q) bits and the value 0 is placed in each of the lower (p+q) bits.

For example, let the digital value D₇, output from the A/D converting circuit 27 and input into the bit shifting circuit 28, be an 8-bit data and the value of each of p and q be 4. In this case, the digital value D₈, output from the bit shifting circuit 28 is a 16 bit data and the dynamic range thereof is 64 k (≅2¹⁶).

Operations of the photodetector 1 according to the present embodiment shall now be described. The intensity of light incident on each of the M×N photodiodes PD_(1,1) to PD_(M,N) is not uniform in general and differs according to the position (m, n). In the following, a description shall be provided for each of a case where the amount of light incident on the photodiode PD_(m,n) is comparatively low, a case where the amount of light incident on the photodiode PD_(m,n) is of an intermediate level, and a case where the amount of light incident on the photodiode PD_(m,n) is comparatively high. The following operations are carried out based on control signals output from an unillustrated control circuit.

Each of FIG. 6 to FIG. 8 is a timing chart for describing the operations of the photodetector 1 according to the embodiment. FIG. 6 is for describing the operations of the first signal processing unit 10 _(m,n) when the amount of light incident on the photodiode PD_(m,n) is comparatively low. FIG. 7 is for describing the operations of the first signal processing unit 10 _(m,n) when the amount of light incident on the photodiode PD_(m,n) is of an intermediate level. FIG. 8 is for describing the operations of the first signal processing unit 10 _(m,n) when the amount of light incident on the photodiode PD_(m,n) is comparatively high.

In each FIGURE, the level of the Clr signal that is input into the CLR input terminal of each of the D flip-flops 31 and 32 of the comparing circuit 13, the respective opening and closing operations of the switches SW₁₀ to SW₁₂ of the integrating circuit 11, the respective opening and closing operations of the switches SW₂₁ and SW₂₂ of the first holding circuit 12, the voltage V₁ output from the integrating circuit 11, the output level V₃ of the comparator 30 of the comparing circuit 13, and the compared signal S₃ (S₃₁, S₃₂) output from the respective Q output terminals of the D flip-flops 31 and 32 of the comparing circuit 13 are shown in that order from the upper side.

Also, in each FIGURE, the period from a time t₁ to a time t₂ is the accumulating period T₁, the period from a time t₃ to a time t₄ is the accumulating period T₂, and the period from a time t₅ to a time t₆ is the accumulating period T₃.

In all of the cases illustrated in FIG. 6 to FIG. 8, for a fixed period before the time t₁, the Clr signal is set to the high level and the signals (that is, the compared signal S₃ (S₃₁, S₃₂)) output from the respective Q output terminals of the D flip-flops 31 and 32 of the comparing circuit 13 are thereby initialized. Also for fixed periods before the time t₁, the respective switches SW₁₀ to SW₁₂ of the integrating circuit 11 are closed to discharge the respective capacitors C₁₀ to C₁₂ and initialize the voltage V₁ output from the integrating circuit 11.

During the accumulating period T₁, from the time t₁ to the time t₂, the switches SW₁₀ to SW₁₂ of the integrating circuit 11 are opened and the variable capacitor unit of the integrating circuit 11 is set to the capacitance value C₁ (the abovementioned formula (1a)). The charges generated at the photodiode PD_(m,n) are accumulated into the variable capacitor unit of the integrating circuit 11 of the first signal processing unit 10 _(m,n), and the voltage V₁ that is in accordance with the amount of the accumulated charges is output from the integrating circuit 11. This voltage V₁ increases gradually from the initial value at the time t₁.

During the period from the time t₂ to the time t₃ (that is, the period between the accumulating period T₁ and the accumulating period T₂), the switches SW₁₀ and SW₁₁ of the integrating circuit 11 are closed to discharge the capacitors C₁₀ and C₁₁ and initialize the voltage V₁ output from the integrating circuit 11.

During the accumulating period T₂, from the time t₃ to the time t₄, the switch SW₁₀ of the integrating circuit 11 is opened, the SW₁₂ is kept open, the switch SW₁₁ is closed, and the variable capacitor unit of the integrating circuit 11 is thereby set to the capacitance value C₂ (the abovementioned formula (1b)). The charges generated at the photodiode PD_(m,n) are accumulated into the variable capacitor unit of the integrating circuit 11 of the first signal processing unit 10 _(m,n), and the voltage V₁ that is in accordance with the amount of the accumulated charges is output from the integrating circuit 11. This voltage V₁ increases gradually from the initial value at the time t₃.

During the period from the time t₄ to the time t₅ (that is, the period between the accumulating period T₂ and the accumulating period T₃), the switches SW₁₀, SW₁₁, and SW₁₂ of the integrating circuit 11 are closed to discharge the capacitors C₁₀, C₁₁, and C₁₂ and initialize the voltage V₁ output from the integrating circuit 11.

During the accumulating period T₃, from the time t₅ to the time t₆, the switch SW₁₀ of the integrating circuit 11 is opened, the respective switches SW₁₁ and SW₁₂ are closed, and the variable capacitor unit of the integrating circuit 11 is thereby set to the capacitance value C₃ (the abovementioned formula (1c)). The charges generated at the photodiode PD_(m,n) are accumulated into the variable capacitor unit of the integrating circuit 11 of the first signal processing unit 10 _(m,n), and the voltage V₁ that is in accordance with the amount of the accumulated charges is output from the integrating circuit 11. This voltage V₁ increases gradually from the initial value at the time t₅.

In each of an initial fixed period of the accumulating period T₁ (that is, a fixed period immediately after the time t₁), an initial fixed period of the accumulating period T₂ (that is, a fixed period immediately after the time t₃), and an initial fixed period of the accumulating period T₃ (that is, a fixed period immediately after the time t₅), the switch SW₂₁ of the first holding circuit 12 is closed and the voltage V₂ output from the first holding circuit 12 is initialized. The switch SW₂₂ of the first holding circuit 12 is also closed before the time t₁.

The description of the operations up until now applies in common to each of the cases of FIG. 6 to FIG. 8. However, the first signal processing unit 10 _(m,n) operates differently according to the magnitude of the amount of light incident onto the photodiode PD_(m,n) as shall be described below.

The operations of the first signal processing unit 10 _(m,n) when the amount of light incident on the photodiode PD_(m,n) is comparatively low are shown in FIG. 6. In this case, each of the voltage V_(1,1) output from the integrating circuit 11 at the end of the accumulating period T₁, the voltage V_(1,2) output from the integrating circuit 11 at the end of the accumulating period T₂, and the voltage V_(1,3) output from the integrating circuit 11 at the end of the accumulating period T₃ is less than the reference voltage V_(ref). Thus in all of the accumulating periods T₁ to T₃, the output level V₃ of the comparator 30 of the comparing circuit 13 stays at the low level, and the signals S₃₁ and S₃₂ output from the respective Q output terminals of the D flip-flops 31 and 32 stay at the low level.

At the point in time at which the voltage V_(1,1), output from the integrating circuit 11 at the end of the accumulating period T₁ (immediately before the time t₂), is judged to be less than the reference voltage V_(ref), the switch SW₂₂ of the first holding circuit 12, which was closed until then, opens and the switch SW₂₂ stays open thereafter. Consequently, the voltage V₂ that is output from the first holding circuit 12 from the time t₂ onward is in accordance with the difference between the voltage V_(1,1) output from the integrating circuit 11 at the point in time at which the switch SW₂₂ became open at the end of the accumulating period T₁ and the voltage, output from the integrating circuit 11 at the point in time at which the switch SW₂₁ became open at the beginning of the accumulating period T₁. Furthermore, this voltage V₂ is held by the second holding circuit 14.

The operations of the first signal processing unit 10 _(m,n) when the amount of light incident on the photodiode PD_(m,n) is of an intermediate level are shown in FIG. 7. In this case, whereas the voltage V_(1,1) output from the integrating circuit 11 at the end of the accumulating period T₁ is equal to or greater than the reference voltage V_(ref), each of the voltage V_(1,2) output from the integrating circuit 11 at the end of the accumulating period T₂ and the voltage V_(1,3) output from the integrating circuit 11 at the end of the accumulating period T₃ is less than the reference voltage V_(ref).

Thus at some point in time within the accumulating period T₁ (the point in time at which the output voltage V₁ from the integrating circuit 11 becomes equal to or greater than the reference voltage V_(ref)), the output level V₃ of the comparator 30 of the comparing circuit 13 switches to the high level, and the signal S₃₁ output from the Q output terminal of the D flip-flop 31 changes to the high level. From the time t₂ onward, the signal S₃₁ output from the Q output terminal of the D flip-flop 31 stays at the high level and the signal S₃₂ output from the Q output terminal of the D flip-flop 32 stays at the low level.

At the point in time at which the voltage V_(1,2), output from the integrating circuit 11 at the end of the accumulating period T₂ (immediately before the time t₄), is judged to be less than the reference voltage V_(ref), the switch SW₂₂ of the first holding circuit 12, which was closed until then, opens and the switch SW₂₂ stays open thereafter. Consequently, the voltage V₂ that is output from the first holding circuit 12 from the time t₄ onward is in accordance with the difference between the voltage V_(1,2), output from the integrating circuit 11 at the point in time at which the switch SW₂₂ became open at the end of the accumulating period T₂, and the voltage, output from the integrating circuit 11 at the point in time at which the switch SW₂₁ became open at the beginning of the accumulating period T₂. Furthermore, this voltage V₂ is held by the second holding circuit 14.

The operations of the first signal processing unit 10 _(m,n) when the amount of light incident on the photodiode PD_(m,n) is comparatively high are shown in FIG. 8. In this case, whereas each of the voltage V_(1,1) output from the integrating circuit 11 at the end of the accumulating period T₁ and the voltage V_(1,2) output from the integrating circuit 11 at the end of the accumulating period T₂ is equal to or greater than the reference voltage V_(ref), the voltage V_(1,3) output from the integrating circuit 11 at the end of the accumulating period T₃ is less than the reference voltage V_(ref).

Thus at some point in time within the accumulating period T₁ (the time at which the output voltage V₁ from the integrating circuit 11 becomes equal to or greater than the reference voltage V_(ref)), the output level V₃ of the comparator 30 of the comparing circuit 13 switches to the high level, and the signal S₃₁ output from the Q output terminal of the D flip-flop 31 changes to the high level. Furthermore, at some time within the accumulating period T₂ (the time at which the output voltage V₁ from the integrating circuit 11 becomes equal to or greater than the reference voltage V_(ref)), the output level V₃ of the comparator 30 of the comparing circuit 13 switches to the high level, and the signal S₃₂ output from the Q output terminal of the D flip-flop 32 also changes to the high level. From the time t₄ onwards, the signals S₃₁ and S₃₂ output from the respective Q output terminals of the D flip-flops 31 and 32 stay at the high level.

At the point in time at which the voltage V_(1,3), output from the integrating circuit 11 at the end of the accumulating period T₃ (immediately before the time t₆), is judged to be less than the reference voltage V_(ref), the switch SW₂₂ of the first holding circuit 12, which was closed until then, opens and the switch SW₂₂ stays open thereafter. Consequently, the voltage V₂ that is output from the first holding circuit 12 from the time t₆ onward is in accordance with the difference between the voltage V_(1,3), output from the integrating circuit 11 at the point in time at which the switch SW₂₂ became open at the end of the accumulating period T₃, and the voltage, output from the integrating circuit 11 at the point in time at which the switch SW₂₁ became open at the beginning of the accumulating period T₃. Furthermore, this voltage V₂ is held by the second holding circuit 14.

The compared signal S₃ (S₃₁, S₃₂), output from the comparing circuit 13 at time t₆ onward, expresses the level of the amount of light incident on the photodiode PD_(m,n) in three stages.

That the compared signal S₃ (S₃₁, S₃₂) is (0, 0) thus signifies that even if charges generated at the photodiode PD_(m,n) are accumulated into the variable capacitor unit over the accumulating period T₁ with the variable capacitor unit of the integrating circuit 11 being set to the capacitance value C₁, the output voltage V_(1,1) at the end of the accumulating period T₁ is less than the reference voltage V_(ref), in other words, the amount of light incident on the photodiode PD_(m,n) is comparatively low.

That the compared signal S₃ (S₃₁, S₃₂) is (1, 0) signifies that though the output voltage V_(1,1) at the end of the accumulating period T₁ is equal to or greater than the reference voltage V_(ref), even if charges generated at the photodiode PD_(m,n) are accumulated into the variable capacitor unit over the accumulating period T₂ with the variable capacitor unit of the integrating circuit 11 being set to the capacitance value C₂, the output voltage V_(1,2) at the end of the accumulating period T₂ is less than the reference voltage V_(ref), in other words, the amount of light incident on the photodiode PD_(m,n) is of an intermediate level.

That the compared signal S₃ (S₃₁, S₃₂) is (1, 1) signifies that though the output voltage V_(1,2) at the end of the accumulating period T₂ is equal to or greater than the reference voltage V_(ref), even if charges generated at the photodiode PD_(m,n) are accumulated into the variable capacitor unit over the accumulating period T₃ with the variable capacitor unit of the integrating circuit 11 being set to the capacitance value C₃, the output voltage V_(1,3) at the end of the accumulating period T₃ is less than the reference voltage V_(ref), in other words, the amount of light incident on the photodiode PD_(m,n) is comparatively high.

The voltages respectively held in the first holding circuit 12 and the second holding circuit 14 at time t₆ and onward correspond to being the voltage, among the voltages V_(1,1) to V_(1,3) output from the integrating circuit 11 at the respective ends of the accumulating periods T₁ to T₃, that first became less than the reference voltage V_(ref).

Onward from time t₆, the charges Q₄ are output successively from the respective second holding circuits 14 of the M×N first signal processing units 10 _(1,1) to 10 _(M,N) to the switched capacitor circuit 26, and the compared signal S₃ is output from the latching circuit 15 to the bit shifting circuit 28.

At the switched capacitor circuit 26, the charges Q₄ that have been successively output from the second holding circuit 14 of each first signal processing unit 10 _(m,n) are input, these charges Q₄ are held in the capacitor C₆, and the voltage V₆ that is in accordance with the amount of charges held is output to the A/D converting circuit 27. At the A/D converting circuit 27, the voltage V₆ output from the switched capacitor circuit 26 is input, this voltage V₆ (analog value) is converted into a digital value, and this digital value D₇ is output.

The digital value D₇ output from the A/D converting circuit 27 and the compared signal S₃ output from the comparing circuit 13 are input into the bit shifting circuit 28. The digital value D₇ is then bit shifted based on the compared signal S₃, and the bit-shifted digital value D₈ is output. Here, if the compared signal S₃ (S₃₁, S₃₂) is (0,0), the output digital value D₈ is the same in value as the input digital value D₇, and the value 0 is placed in each of the upper (p+q) bits (FIG. 5-(a)).

If the compared signal S₃ (S₃₁, S₃₂) is (1,0), the output digital value D₈ takes on the value obtained by shifting the input digital value D₇ upward by just p bits and the value 0 is placed in each of the lower p bits and the upper q bits (FIG. 5-(a)). If the compared signal S₃ (S₃₁, S₃₂) is (1,1), the output digital value D₈ takes on the value obtained by shifting the input digital value D₇ upward by just (p+q) bits and the value 0 is placed in each of the lower (p+q) bits (FIG. 5-(c)).

Data (V₂, S₃), concerning the amount of light incident on the photodiode PD_(m,n) in the period from the time t₁ to the time t₆, are thus held in the second holding circuit 14 and the latching circuit 15 of the corresponding first signal processing unit 10 _(m,n). In this state, the relationships of the above-described formula (2) or (3) hold for the capacitance value C_(k) of the variable capacitor unit of the integrating circuit 11 and the accumulating period T_(k), the voltage V₂ is held by the second holding circuit 14 when the voltage V₁, which is in accordance with the amount of charges accumulated in the variable capacitor unit of the integrating circuit 11 in one of the accumulating periods, is less than the reference voltage V_(ref), and the compared signal S₃, expressing the accumulating period at which the held voltage V₂ is obtained, is stored by the loatching circuit 15.

Then based on the data (Q₄, S₃), output from the second holding circuit 14 and the latching circuit 15 of each first signal processing unit 10 _(m,n) from the subsequent time t₆ onward, the voltage, which is in accordance with the charges Q₄ and results from the conversion by the switched capacitor circuit 26, is A/D converted by the A/D converting circuit 27 of the second signal processing unit 20, and the digital value is bit shifted as necessary by the bit shifting circuit 28.

This photodetector 1 is thus wide in the dynamic range of incident light amount detection. Also because the charges generated at the photodiode PD_(m,n) is accumulated in the capacitor of the integrating circuit 11 and the voltage V₁ that is in accordance with the amount of the accumulated charges is output from the integrating circuit 11, the temperature dependence of the incident light amount detection is small.

Also, by the provision of the second holding circuit 14 and the latching circuit 15, in the same period, from the time t₆ onward, in which the image pickup data (V₂, S₃), obtained by the respective photodiodes PD_(m,n) and the respective first signal processing units 10 _(m,n) in the period from the time t₁ to the time t₆, are processed at the second signal processing unit 20, the subsequent set of image pickup data (V₂, S₃) are obtained by the respective photodiodes PD_(m,n) and the respective first signal processing units 10 _(m,n). The photodetector 1 can thus perform high-speed image pickup.

Also because the first holding circuit 12 serves in common as a CDS circuit, the error of the output voltage V₁ due to noise generated during resetting of the amplifier A₁ of the integrating circuit 11 is reduced, and the photodetector 1 can thus obtain more accurate image pickup data.

The present invention is not restricted to the above-described embodiment and may be modified in various ways. For example, though with the above-described embodiment, the comparing circuit 13 performs quantitative comparison of the voltage V₁ output from the integrating circuit 11 with the reference voltage V_(ref), quantitative comparison of the voltage V₂ output from the first holding circuit 12 with the reference voltage V_(ref) may be performed instead.

Also, the circuit arrangement of the photodetector is not restricted to that described with the embodiment above and may take on other forms. For example, the photodiodes are not restricted to a two-dimensional array and may be arrayed one-dimensionally or may be a single photodiode. The capacitance value of the variable capacitor unit of the integrating circuit may be switchable in two stages or four or more stages. Other circuit arrangements are possible for the first holding circuit, the comparing circuit, the second holding circuit, etc., as well. Also, a single first signal processing unit may be provided for a plurality of photodiodes.

INDUSTRIAL APPLICABILITY

The present invention can be used in a photodetector. 

1. A photodetector comprising: a photodiode, generating charges of an amount that is in accordance with an incident light amount; an integrating circuit, having a variable capacitor unit that is selectively set to a capacitance value C_(n) among K capacitance values C₁ to C_(K), accumulating charges, output from the photodiode, into the variable capacitor unit over an accumulating period T_(k) that is in accordance with a capacitance value C_(k) set in the variable capacitor unit, and outputting a voltage according to the amount of the accumulated charges; a first holding circuit, holding the voltage output from the integrating circuit at the end of an accumulating period T_(k) among accumulating periods T₁ to T_(K) and outputting the held voltage; and a comparing circuit, inputting the voltage output from the integrating circuit or the first holding circuit, performing a quantitative comparison of the input voltage with a reference voltage, outputting a compared signal expressing the comparing result, and, when the voltage output from the integrating circuit or the first holding circuit at the end of an accumulating period T_(k) is less than the reference voltage, instructing the first holding circuit to hold the voltage; wherein the value of a ratio, (T_(k)/C_(k)), differs according to the value of k (where K is an integer no less than 2 and k is an arbitrary integer no less than 1 and no more than K).
 2. The photodetector according to claim 1, wherein a ratio of a ratio (T_(k1)/C_(k1)) with respect to a ratio (T_(k2)/C_(k2)) is a power of 2 (where each of k1 and k2 is an arbitrary integer no less than 1 and no more than K, and k1≠k2).
 3. The photodetector according to claim 1, wherein the first holding circuit serves in common as a CDS circuit that inputs the voltage output from the integrating circuit and holds and outputs a voltage that is in accordance with the difference of the voltages that are input at a beginning and an end of the accumulating period T_(k).
 4. The photodetector according to claim 1, further comprising: a second holding circuit, inputting a voltage output from the first holding circuit, holding the voltage at a specific point in time, and outputting the held voltage; and a latching circuit, inputting a compared signal output from the comparing circuit, storing the compared signal at the specific point in time, and outputting the stored compared signal.
 5. The photodetector according to claim 1, further comprising: an A/D converting circuit, inputting the voltage output from the first holding circuit, converting the input voltage into a digital value, and outputting the digital value.
 6. The photodetector according to claim 5, further comprising: a bit shifting circuit, inputting the digital value output from the A/D converting circuit, inputting the compared signal output from the comparing circuit, bit shifting the digital value based on the compared signal, and outputting the bit-shifted digital value.
 7. The photodetector according to claim 5, further comprising: a switched capacitor circuit, inputting the voltage output from the first holding circuit, holding the voltage in a capacitor unit, and outputting the held voltage to the A/D converting circuit.
 8. The photodetector according to claim 5, comprising a plurality of sets of the photodiode, the integrating circuit, the first holding circuit, and the comparing circuit and has a single the A/D converting circuit for the plurality of sets. 